Application of micro-XRF for nuclear materials characterization and problem solving
Worley, Christopher G., Tandon, Lav, Martinez, Patrick T., Decker, Diana L.Том:
28
Мова:
english
Журнал:
Powder Diffraction
DOI:
10.1017/s0885715613000201
Date:
June, 2013
Файл:
PDF, 308 KB
english, 2013