Scanning Transmission X-ray Microscopes at the Advanced Light Source: Performance and Experimental Capabilities
Tyliszczak, Tolek, Kilcoyne, A. L. David, Liddle, J. Alexander, Warwick, Tony, Hitchcock, Adam P., Ade, Harald, Shuh, David K.Том:
10
Мова:
english
Журнал:
Microscopy and Microanalysis
DOI:
10.1017/s1431927604883855
Date:
August, 2004
Файл:
PDF, 321 KB
english, 2004