Application of X-ray Photoelectron Spectroscopy (XPS) for the Surface Characterization of Gunshot Residue (GSR)
Schwoeble, A. J. “Skip”, Strohmeier, Brian R., Bunker, Kristin L., McAllister, Darlene R., Marquis, James P., Piasecki, John D., McAllister, Nikki M.Том:
19
Мова:
english
Журнал:
Microscopy Today
DOI:
10.1017/s1551929511000113
Date:
March, 2011
Файл:
PDF, 1.21 MB
english, 2011