SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, United States (Saturday 13 February 2016)] Laser 3D Manufacturing III - Towards in-situ process monitoring in selective laser sintering using optical coherence tomography
Gu, Bo, Helvajian, Henry, Piqué, Alberto, Guan, Guangying, Lu, Zeng H., Hirsch, Matthias, Goodridge, Ruth, Childs, David T. D., Matcher, Stephen J., Clare, Adam T., Groom, Kristian M.Том:
9738
Рік:
2016
Мова:
english
DOI:
10.1117/12.2210992
Файл:
PDF, 1.13 MB
english, 2016
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