Reduction Process of Dislocation and Standby Leakage Current for Embedded Flash Memory Using Nano-Scale Integration
Sun, Jong-Won, Park, Ji Hwan, Yang, Taek-Seung, Choi, Heesoo, Cui, Yinhua, Choi, Eunmi, Kim, Areum, Oh, Lee Seul, Lee, Sun Jae, Park, Hyunjin, Kim, Chang Hyun, Kim, Soo-Kil, Son, Hyungbin, Lee, Dong HТом:
13
Мова:
english
Журнал:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2013.7172
Date:
June, 2013
Файл:
PDF, 2.64 MB
english, 2013
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