SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2013) - Beijing, China (Sunday 17 November 2013)] 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Design and analysis on front-end electronics of InGaAs photoelectric detector
Liu, Xiang, Tam, Hwa-Yaw, Xu, Kexin, Xiao, Hai, Zhu, Jigui, Zhao, Chun-LiuТом:
9046
Рік:
2013
Мова:
english
DOI:
10.1117/12.2037422
Файл:
PDF, 320 KB
english, 2013