SPIE Proceedings [SPIE SPIE Medical Imaging - San Diego, California, United States (Saturday 27 February 2016)] Medical Imaging 2016: Physics of Medical Imaging - Investigation of noise and contrast sensitivity of an electron multiplying charge-coupled device (EMCCD) based cone beam micro-CT system
Kontos, Despina, Flohr, Thomas G., Lo, Joseph Y., Bysani Krishnakumar, Sumukh, Podgorsak, Alexander R., Setlur Nagesh, S. V., Jain, Amit, Rudin, Stephen, Bednarek, Daniel R., Ionita, Ciprian N.Том:
9783
Рік:
2016
Мова:
english
DOI:
10.1117/12.2216794
Файл:
PDF, 1.28 MB
english, 2016