SPIE Proceedings [SPIE BiOS - San Francisco, California (Saturday 23 January 2010)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII - Photobleaching property of confocal laser scanning microscopy with masked illumination
Kim, DongUk, Conchello, Jose-Angel, Cogswell, Carol J., Moon, Sucbei, Song, Hoseong, Wilson, Tony, Brown, Thomas G., Yang, Wenzhong, Kim, Dug Y.Том:
7570
Рік:
2010
Мова:
english
DOI:
10.1117/12.841965
Файл:
PDF, 1.10 MB
english, 2010