SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Advances in Thin Film Coatings for Optical Applications - Characterization of C70 doped poly(styrene) -b- poly(hexyl methacrylate) (PS-PHMA) thin film on c-Si substrate with a Jobin Yvon UVISEL phase- modulated spectroscopic ellipsometer (PMSE).
Kramer, Alan R., Yao, Nan, Pelletier, Vincent, Kruschwitz, Jennifer D. T., Oliver, James B.Том:
5527
Рік:
2004
Мова:
english
DOI:
10.1117/12.559705
Файл:
PDF, 118 KB
english, 2004
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