SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Design and Testing V - Wafer-level micro-optics: trends in manufacturing, testing, packaging, and applications
Voelkel, Reinhard, Gong, Li, Rieck, Juergen, Zheng, Alan, Wang, Yongtian, Du, Chunlei, Hua, Hong, Tatsuno, Kimio, Urbach, H. PaulТом:
8557
Рік:
2012
Мова:
english
DOI:
10.1117/12.981779
Файл:
PDF, 949 KB
english, 2012