SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X - Actively shielded CZT focal plane detectors for the Fine Angular Resolution X-ray Imaging Telescope (FAR_XITE)
Rothschild, Richard E., Gruber, Duane E., Heindl, William A., Matteson, James L., Ulmer, Melville P., Altkorn, Robert I., Matz, Steven M., Hink, Paul L., Krieger, Allen S., Staubert, Ruediger, Tumer,Том:
3765
Рік:
1999
Мова:
english
DOI:
10.1117/12.366561
Файл:
PDF, 758 KB
english, 1999