SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Photovoltaic effect of different thickness vanadium oxide thin film
Wei, Xiongbang, Pan, Junhua, Wyant, James C., Wu, Zhiming, Wang, Tao, Wang, Hexin, Li, Shibin, Tang, Jingjing, Jiang, YadongТом:
6723
Рік:
2007
Мова:
english
DOI:
10.1117/12.783590
Файл:
PDF, 356 KB
english, 2007
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