SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Scattering and Surface Roughness - Scanning scattering microscope for surface and buried interface roughness and defect imaging
Lorincik, Jan, Fine, Joseph, Gillen, Greg, Gu, Zu-Han, Maradudin, Alexei A.Том:
3141
Рік:
1997
Мова:
english
DOI:
10.1117/12.279242
Файл:
PDF, 1.22 MB
english, 1997
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