SPIE Proceedings [SPIE Thin Film Physics and Applications: Second International Conference - Shanghai, China (Friday 15 April 1994)] Second International Conference on Thin Film Physics and Applications - X-ray reflectivity analysis of Pt/Co multilayered films
Jiang, Zhihong, Kuo, Chang-Lin, Guo, Rongfa, Shen, Defang, Shi, Tian-Shen, Zhou, Shixun, Wang, Yongling, Chen, Yi-Xin, Mao, ShuzhengТом:
2364
Рік:
1994
Мова:
english
DOI:
10.1117/12.190755
Файл:
PDF, 232 KB
english, 1994
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