SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - Use of fluorescence and scanning electron microscopy as tools in teaching biology
Ghosh, Nabarun, Postek, Michael T., Newbury, Dale E., Silva, Jessica, Vazquez, Aracely, Platek, S. Frank, Joy, David C., Das, A B., Smith, Don W., Maugel, Tim K.Том:
8036
Рік:
2011
Мова:
english
DOI:
10.1117/12.883925
Файл:
PDF, 3.02 MB
english, 2011
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