SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Optical Microlithography XVII - Alternating phase-shifting mask design for low aberration sensitivity
Mak, Giuseppe Y., Smith, Bruce W., Wong, Alfred K., Lam, Edmund Y.Том:
5377
Рік:
2004
Мова:
english
DOI:
10.1117/12.534686
Файл:
PDF, 200 KB
english, 2004