SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Novel beam orienting mechanism using beam nutating and coherent detecting technologies
Jin, Tao, Hou, Xun, Yuan, Jiahu, Pan, Hudi, Liu, Jin, Wyant, James C., Wang, Hexin, Gu, Lei, Han, SenТом:
6150
Рік:
2005
Мова:
english
DOI:
10.1117/12.677987
Файл:
PDF, 225 KB
english, 2005