SPIE Proceedings [SPIE Laser Anemometry: Advances and Applications--Fifth International Conference - Koningshof, Veldhoven, Netherlands (Monday 23 August 1993)] Fifth International Conference on Laser Anemometry: Advances and Applications - Certainties and uncertainties about safe laser-exposure limits
Vos, Johannes J., Bessem, J. M., Booij, R., Godefroy, H. W. H. E., de Groot, P. J., Prasad, K. K., de Mul, F. F. M., Nijhof, E. J.Том:
2052
Рік:
1993
Мова:
english
DOI:
10.1117/12.150540
Файл:
PDF, 460 KB
english, 1993