SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Fluctuations and Noise in Materials - Noise measurements in NbN semiconductors thin films deposited on sapphire
Leroy, Gerard, Popovic, Dragana, Weissman, Michael B., Gest, Joel, Vandamme, Lode K. J., Racz, Zoltan A., Bourgeois, OlivierТом:
5469
Рік:
2004
Мова:
english
DOI:
10.1117/12.546507
Файл:
PDF, 248 KB
english, 2004