SPIE Proceedings [SPIE Third International Workshop on Laser Beam and Optics Characterization - Quebec City, Canada (Monday 8 July 1996)] Third International Workshop on Laser Beam and Optics Characterization - Surface-emitting laser diode beam characterization (Abstract Only)
Jones, Richard D., Obarski, Gregory E., Livigni, David J., Laabs, Holger, Morin, Michel, Giesen, AdolfТом:
2870
Рік:
1996
Мова:
english
DOI:
10.1117/12.259921
Файл:
PDF, 23 KB
english, 1996