SPIE Proceedings [SPIE 4th International Conference on Thin Film Physics and Applications - Shanghai, China (Monday 8 May 2000)] Fourth International Conference on Thin Film Physics and Applications - RFTIR measurement on backside-thinned detector film of InSb infrared focal plane arrays
Chen, Bo-Liang, Yang, Hua, Hu, Xiaoning, Lin, Juncao, Chu, Junhao, Liu, Pulin, Chang, YongТом:
4086
Рік:
2000
Мова:
english
DOI:
10.1117/12.408419
Файл:
PDF, 135 KB
english, 2000