SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Recent Developments in Traceable Dimensional Measurements II - Angle metrology using AAMACS and two small-angle measurement systems
Stone, Jack A., Decker, Jennifer E., Brown, Nicholas, Amer, Mohamed, Faust, Bryon, Zimmerman, JayТом:
5190
Рік:
2003
Мова:
english
DOI:
10.1117/12.506481
Файл:
PDF, 122 KB
english, 2003
File converter
Більше результатів пошуку
More benefits 
