SPIE Proceedings [SPIE San Diego, '91, San Diego, CA - San Diego, CA (Sunday 21 July 1991)] Optical Scatter: Applications, Measurement, and Theory - Determination of thin-film roughness and volume structure parameters from light-scattering investigations
Duparre, Angela, Kassam, Samer, Stover, John C.Том:
1530
Рік:
1991
Мова:
english
DOI:
10.1117/12.50526
Файл:
PDF, 129 KB
english, 1991