SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Ultraviolet Ground- and Space-based Measurements, Models, and Effects IV - Measuring aerosol UV absorption optical thickness by combining use of shadowband and almucantar techniques
Krotkov, Nickolay A., Slusser, James R., Herman, Jay R., Bhartia, Pawan K., Herman, Jay R., Gao, Wei, Bernhard, Germar, Slusser, James, Scott, Gwen, Labow, Gordon, Vasilkov, Alexander P., Eck, Thomas,Том:
5545
Рік:
2004
Мова:
english
DOI:
10.1117/12.559557
Файл:
PDF, 539 KB
english, 2004