SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Applications of Digital Image Processing XVIII - Signature verification based on distortion measure and spectral correlation
Wen, Chi-Jain, Chang, Ming-Wen, Jeng, Bor-Shenn, Yau, Hon-Fai, Tescher, Andrew G.Том:
2564
Рік:
1995
Мова:
english
DOI:
10.1117/12.217407
Файл:
PDF, 217 KB
english, 1995