SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Research on accelerometer based on multi-mode interference
Zhou, Qiaofen, Jiang, Ya-Dong, Kippelen, Bernard, Hou, Changlun, Yang, Guoguang, Yu, Junsheng, Bai, Jian, Zhao, ShuangshuangТом:
7658
Рік:
2010
Мова:
english
DOI:
10.1117/12.865549
Файл:
PDF, 651 KB
english, 2010
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