SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Laser Interferometry IX: Techniques and Analysis - Real-time two-color laser speckle-shift strain measurement system
Tuma, Meg L., Greer III, Lawrence C., Krasowski, Michael J., Oberle, Lawrence G., Elam, Kristie A., Spina, Daniel C., Kujawinska, Malgorzata, Brown, Gordon M., Takeda, MitsuoТом:
3478
Рік:
1998
Мова:
english
DOI:
10.1117/12.312951
Файл:
PDF, 320 KB
english, 1998