[IEEE 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Garden Grove, CA, USA (2016.9.11-2016.9.16)] 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - An ESD control method considering the semiconductor device charged voltage
Wakai, Nobuyuki, Maki, Kunihiro, Kaku, Futoshi, Hirose, Kenji, Setoya, TakashiРік:
2016
Мова:
english
DOI:
10.1109/EOSESD.2016.7592543
Файл:
PDF, 714 KB
english, 2016