Electro- and photoluminescence imaging as fast screening technique of the layer uniformity and device degradation in planar perovskite solar cells
Soufiani, Arman Mahboubi, Tayebjee, Murad J. Y., Meyer, Steffen, Ho-Baillie, Anita, Sung Yun, Jae, MacQueen, Rowan W., Spiccia, Leone, Green, Martin A., Hameiri, ZivТом:
120
Мова:
english
Журнал:
Journal of Applied Physics
DOI:
10.1063/1.4956436
Date:
July, 2016
Файл:
PDF, 1.05 MB
english, 2016
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