(Invited) Progress in Buried Grid Technology for Improvements in on-Resistance of High Voltage SiC Devices
Schoner, A., Elahipanah, H., Thierry-Jebali, N., Reshanov, S. A., Kaplan, W., Zhang, A., Lim, J.-K., Bakowski, M.Том:
75
Мова:
english
Журнал:
ECS Transactions
DOI:
10.1149/07512.0183ecst
Date:
September, 2016
Файл:
PDF, 1.58 MB
english, 2016