A New Effective Methodology for Semiconductor Power Devices HTRB Testing
Pace, Calogero, Hernandez-Ambato, Jorge, Fragomeni, Letizia, Consentino, Giuseppe, D'Ignoti, Alessandro, Galiano, Salvatore, Grimaldi, AntonioРік:
2017
Мова:
english
Журнал:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/TIE.2017.2669882
Файл:
PDF, 17.75 MB
english, 2017