Scaling Challenges for Advanced CMOS Devices
Jacob, Ajey P., Xie, Ruilong, Sung, Min Gyu, Liebmann, Lars, Lee, Rinus T. P., Taylor, BillТом:
26
Мова:
english
Журнал:
International Journal of High Speed Electronics and Systems
DOI:
10.1142/S0129156417400018
Date:
March, 2017
Файл:
PDF, 10.97 MB
english, 2017