SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2012 - Constanta, Romania (Thursday 23 August 2012)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI - R3 measurement by white light interferometry
Bojan, Mihaela, Apostol, D., Cernescu, N., Iordache, Iuliana, Damian, V., Schiopu, Paul, Schiopu, Paul, Tamas, RazvanТом:
8411
Рік:
2012
Мова:
english
DOI:
10.1117/12.974491
Файл:
PDF, 338 KB
english, 2012
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