IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
2016 / 8 Vol. 9; Iss. 8
Elevation Changes Inferred From TanDEM-X Data Over the Mont-Blanc Area: Impact of the X-Band Interferometric Bias
Dehecq, Amaury, Millan, Romain, Berthier, Etienne, Gourmelen, Noel, Trouve, Emmanuel, Vionnet, VincentТом:
9
Мова:
english
Журнал:
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing
DOI:
10.1109/jstars.2016.2581482
Date:
August, 2016
Файл:
PDF, 1.29 MB
english, 2016
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