Diagnosis of a soft short and local variations of parameters occurring simultaneously in analog CMOS circuits
Tadeusiewicz, Michał, Hałgas, StanisławТом:
72
Мова:
english
Журнал:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.03.025
Date:
May, 2017
Файл:
PDF, 580 KB
english, 2017