Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals
Wu, Yanfei, Ren, Xinglong, McGarry, Kathryn A., Bruzek, Matthew J., Douglas, Christopher J., Frisbie, C. DanielМова:
english
Журнал:
Advanced Electronic Materials
DOI:
10.1002/aelm.201700117
Date:
May, 2017
Файл:
PDF, 1.99 MB
english, 2017
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