AIP Conference Proceedings [AIP Publishing LLC BAYESIAN INFERENCE AND MAXIMUM ENTROPY METHODS IN SCIENCE AND ENGINEERING (MAXENT 2014) - Clos Lucé, Amboise, France (21–26 September 2014)] - Non parametric denoising methods based on wavelets: Application to electron microscopy images in low exposure time
Soumia, Sid Ahmed, Messali, Zoubeida, Ouahabi, Abdeldjalil, Trepout, Sylvain, Messaoudi, Cedric, Marco, SergioТом:
1641
Рік:
2015
Мова:
english
DOI:
10.1063/1.4906004
Файл:
PDF, 699 KB
english, 2015
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