[IEEE 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Tampa, FL, USA (2017.3.26-2017.3.30)] 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Analytical and experimental optimization of external gate resistance for safe rapid turn on of normally off GaN HFETs
Barchowsky, Ansel, Kozak, Joseph P., Hontz, Michael R., Stanchina, William E., Reed, Gregory F., Mao, Zhi-Hong, Khanna, RaghavРік:
2017
Мова:
english
DOI:
10.1109/APEC.2017.7930966
Файл:
PDF, 1.05 MB
english, 2017
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