First conductive atomic force microscopy investigation on the oxide-film removal mechanism by chloride fluxes in aluminum brazing
Zhu, Ziang, Chen, Yiqing, Luo, Alan A., Liu, LihuaТом:
138
Мова:
english
Журнал:
Scripta Materialia
DOI:
10.1016/j.scriptamat.2017.05.020
Date:
September, 2017
Файл:
PDF, 1.75 MB
english, 2017