SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Infrared Technology and Applications XLIII - An 80x80 microbolometer type thermal imaging sensor using the LWIR-band CMOS infrared (CIR) technology
Andresen, Bjørn F., Fulop, Gabor F., Hanson, Charles M., Miller, John L., Norton, Paul R., Tankut, Firat, Cologlu, Mustafa H., Askar, Hidir, Ozturk, Hande, Dumanli, Hilal K., Oruc, Feyza, Tilkioglu, BТом:
10177
Рік:
2017
Мова:
english
DOI:
10.1117/12.2275161
Файл:
PDF, 1.84 MB
english, 2017