Changes in morphology and local conductance of GeTe–Sb 2 Te 3 superlattice films on silicon observed by scanning probe microscopy in a lithography mode
Bolotov, Leonid, Tada, Tetsuya, Saito, Yuta, Tominaga, JunjiТом:
55
Мова:
english
Журнал:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.55.04EK02
Date:
April, 2016
Файл:
PDF, 1.84 MB
english, 2016
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