Structural and spectroscopic analysis of ex-situ annealed RF sputtered aluminium doped zinc oxide thin films
Otieno, Francis, Airo, Mildred, Erasmus, Rudolph M., Billing, David G., Quandt, Alexander, Wamwangi, DanielТом:
122
Мова:
english
Журнал:
Journal of Applied Physics
DOI:
10.1063/1.4998939
Date:
August, 2017
Файл:
PDF, 8.33 MB
english, 2017