[IEEE 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) - Sapporo, Japan (2017.5.28-2017.6.1)] 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) - Direct photo emission monitoring for analysis of IGBT destruction mechanism using streak camera
Matsudai, Tomoko, Endo, Koichi, Ogura, Tsuneo, Matsumoto, Toru, Uchiyama, Koro, Niikura, Fuminori, Koshikawa, KazushigeРік:
2017
DOI:
10.23919/ISPSD.2017.7988945
Файл:
PDF, 691 KB
2017