Materials assurance through orthogonal materials measurements: X-ray fluorescence aspects
Rodriguez, Mark A., Van Benthem, Mark H., Susan, Donald F., Griego, James J. M., Yang, Pin, Mowry, Curtis D., Enos, David G.Том:
32
Мова:
english
Журнал:
Powder Diffraction
DOI:
10.1017/S0885715617000446
Date:
June, 2017
Файл:
PDF, 629 KB
english, 2017