Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging
Wan, Quan, Abrams, Kerry J., Masters, Robert C., Talari, Abdullah C. S., Rehman, Ihtesham U., Claeyssens, Frederik, Holland, Chris, Rodenburg, CorneliaМова:
english
Журнал:
Advanced Materials
DOI:
10.1002/adma.201703510
Date:
November, 2017
Файл:
PDF, 1.75 MB
english, 2017