Investigation on Current Crowding Effect in IGBTs
Yang, Fei, Chen, Hong, Tian, Xiaoli, Bai, Yun, Zhu, YangjunТом:
65
Мова:
english
Журнал:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2017.2782705
Date:
February, 2018
Файл:
PDF, 2.53 MB
english, 2018