SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2 MeV Neutrons
Clemente, Juan Antonio, Hubert, Guillaume, Fraire, Juan, Franco, Francisco J., Villa, Francesca, Rey, Solenne, Baylac, Maud, Puchner, Helmut, Mecha, Hortensia, Velazco, RaoulРік:
2018
Мова:
english
Журнал:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2018.2800905
Файл:
PDF, 828 KB
english, 2018