On the importance of electron–electron scattering for hot-carrier degradation
Tyaginov, Stanislav, Bina, Markus, Franco, Jacopo, Wimmer, Yannick, Kaczer, Ben, Grasser, TiborТом:
54
Мова:
english
Журнал:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.54.04DC18
Date:
April, 2015
Файл:
PDF, 1.63 MB
english, 2015