Pt Gate Sink-In Process Details Impact on InP HEMT DC and RF Performance
Saranovac, Tamara, Hambitzer, Anna, Ruiz, Diego C., Ostinelli, Olivier, Bolognesi, C. R.Том:
30
Мова:
english
Журнал:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/TSM.2017.2749479
Date:
November, 2017
Файл:
PDF, 1.20 MB
english, 2017