[IEEE 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Moscow and St. Petersburg, Russia (2018.1.29-2018.2.1)] 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Comparative analysis of standard cells performance for 7nm FinFET and 28nm CMOS technologies with considering for parasitic elements